ICInside Surveyor
It's like having a virtual SEM on your desktop
Take cost out of design, launch new products sooner, win more sockets, reduce late shipment penalties. The ICInside Surveyor is designed to make it easier to integrate reverse engineering analysis into your forward product design workflows.
Seamlessly navigate massive high magnification SEM-based image mosaics of your competitors’ chips
Accurately measure key features, using the ruler tool, for use in simulation, costing, and yield estimating
View multiple metal layers at one time when tracing signals
Annotate blocks for sharing information within the team and across the organization
It all starts with high quality reverse engineering that effectively decaps and delayers devices cleanly to enable automated SEM mosiacs of 1000's of high magnification images to be taken and stitched together to calibrated standards. Chipworks analysis delivers the competitive intelligence that your product team needs in the detail they require to make faster and better decisions.
ICInside Surveyor for MEMS
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Get deeper inside your competitor by measuring key structures such as capacitor plates, proof masses, springs, etc. Use this information to build your own simulations and better understand the performance of market and technology leading devices. |
| ICInside Surveyor for Circuit Layout |
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Often, a first step in completing a full circuit extraction is a close examination of the layout to focus on critical areas of innovation. ICInside Surveyor is also used for basic functional analysis by helping you understand the device at a block level while also allowing you to measure key features layer by layer. This gives a deeper understanding of the design rules employed.
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For a full list of currently available ICInside Surveyor reports visit the Chipworks Report Library
Get the datasheet for ICInside Surveyor
For an ICInside Surveyor report on any device you need please contact insidetechnology@chipworks.com