SAMPLE REPORT NOTIFICATION

OmniVision OV5642 1.4 µm Backside Illumination CMOS Image Sensor
Imager Process Review (IPR-0907-802)
Circuit Analysis Report (CAR-0908-805)

Key Features

1.4 µm pixel CIS module for camera phones
Backside illuminated CIS in bulk silicon process
OmniBSI™ technology jointly developed by OmniVision/TSMC

About this Device
The OV5642 is a ¼ inch, 5 Mp SoC sensor designed for mobile phones and other small devices. This is OmniVision’s most advanced sensor, featuring both 1.4 µm technology and backside illumination.

The Imager Process Review
The Imager Process Review (IPR) is designed to show clients the process technology used to manufacture the device. It has features specifically designed for the image sensor market.

The Circuit Analysis Report
A Circuit Analysis Report for an image sensor shows the output path from the pixel to the ADC. The analysis is delivered in the ICWorks Browser software for navigating the circuit schematics, cross-referencing the schematics to the layout images, and exporting netlists for simulation.

SAMPLE MONTHLY UPDATE

Recent reports from Chipworks
(click the report link for more information)

Manufacturer	Device	Report Type	Report Code	Device Category
Altera (TSMC 40 nm)	Stratix IV	Package Analysis Structural Analysis Transistor Characterization	PKG-0903-901 SAR-0902-802 TCR-0902-801	FPGA (40 nm CMOS)
AMD	45nm Opteron	Exploratory report with TEM	EXR-0902-812	Microprocessor
Freescale	MMA6222AEG	Exploratory Report ICInside Surveyor Report	EXR-0903-803 ICS-0903-804	Accelerometer
Freescale	SC900777	Circuit Analysis Report	CAR-0809-902	WLED Driver
Impinj	Monza 3rd Gen	Circuit Analysis	CAR-0902-805	RFID
Intel	Atom	Circuit Analysis Circuit Analysis Circuit Analysis	CAR-0901-201 CAR-0812-204 CAR-0812-206	SRAM Cell FUSE Macro I/O Cell
Kiionix	KXSDP9	Exploratory Report ICInside Surveyor	EXR-0902-811 ICS-0902-801	3-Axis Accelerometer
LSI	LSISA1078	Circuit Analysis	CAR-0902-101	RoC ASIC
LSI	LSI53C1030	Circuit Analysis	CAR-0903-101 CAR-0903-102	Hard Drive Controller
Samsung	K4B1GE	ICInside Surveyor Report	ICS-0903-803	SDRAM (56 nm)
Samsung	S5K4CAGX	Imager Process Review	IPR-0902-901	CMOS Image Sensor (2nd gen)
Sandisk	20-82-00162-2	Structural Analysis	SAR-0903-201	NAND Flash Controller
Sandisk	TMCL4	Structural Analysis	SAR-0902-201	32 GB NAND Flash Controller
Sensor Dynamics	SD755	ICInside Surveyor Report MEMS Process Review	ICS-0903-802 MPR-0903-801	Combination MEMS Accelerometer and Gyroscope
Sony	IMX061	Imager Process Review	IPR-0902-801	Backside Illumination CMOS Image Sensor
STMicroelectronics	LIS331DLH	ICInside Surveyor Report Exploratory Report	ICS-0903-801 EXR-0903-801	MEMS 3-Axis Accelerometer
STMicroelectronics	ST21F384	Process Review (eMemory)	PPR-0902-902	Smartcard MCU with eFlash
STMicroelectronics	LY530AL	ICInside Surveyor Report Exploratory Report	ICS-0904-801 EXR-0904-801	MEMS Gyroscope
Texas Instruments	TPS62601	Circuit Analysis Report	CAR-0812-805	DC-DC Regulator (6 MHz)
Volterra	VT1115MF	Process Review	PPR-0902-201	PWM Controller
Volterra	VT1195SF	Circuit Analysis	CAR-0903-203	Voltage Regulator

Exploratory Analysis
Clients can benefit from exploratory analysis on dozens of devices to stay on top to key competitors in their industry. For a complete list of recent devices analyzed in our labs please visit the report library.

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Plus dozens more. Contact us for teardown information or for a complete list of devices.